EOS Dynamics Learning Center

Optics Tutorials

01

Sensor Format, Image Circle and Field of View

Pixel pitch, sensor diagonal, image circle, safe coverage, crop and distortion explained.

1. Sensor Size from Pixel Pitch and Resolution

In electro-optical and infrared imaging systems, sensor width and height should not be guessed only from commercial format names. They can be calculated from detector resolution and pixel pitch.

Sensor Width = Horizontal Pixels × Pixel Pitch (µm) / 1000
Sensor Height = Vertical Pixels × Pixel Pitch (µm)/ 1000

For example, a 640 × 512 detector with 12 µm pixel pitch has a sensor width of 7.68 mm and a sensor height of 6.14 mm.

2. Required Image Circle

The minimum image circle required to cover a sensor is determined by the sensor diagonal. This value comes from the sensor geometry, not from the lens.

Sensor Diagonal = √(Sensor Width² + Sensor Height²)

A lens should provide an image circle larger than the sensor diagonal. For safe engineering use, a margin can be added. In our calculator, a 0.5 mm safety margin is used.

Safe Required Image Circle = Sensor Diagonal + 0.5 mm

3. Lens Image Circle

The actual lens image circle is not calculated from the sensor. It is a lens design or datasheet parameter. It depends on the optical design, mechanical aperture, vignetting, relative illumination, MTF limit and accepted image quality at the field edge.

4. Coverage, Vignetting and Crop

If the lens image circle is smaller than the safe required image circle, the full sensor area may not be safely usable. In that case, vignetting may occur, or a cropped active sensor area may be required.

Coverage Ratio = Lens Image Circle / Sensor Diagonal

If the image circle is smaller than the sensor diagonal, the corners may be outside the usable optical field. If the image circle is slightly larger than the diagonal but has insufficient safety margin, the result should be treated as borderline.

5. Field of View

Field of view is calculated from sensor size and focal length. Horizontal, vertical and diagonal FOV should be evaluated separately, especially when sensor aspect ratio differs from common photography formats.

FOV = 2 × atan(Sensor Dimension / 2f)

6. Distortion

Distortion does not define the image circle itself. However, it affects the geometric accuracy of the field of view and the mapping between object space and image space. For low-distortion lenses, the ideal FOV formula is usually sufficient. For wide-angle or high-distortion optics, distortion should be considered separately as a correction factor.

02

F-number, Aperture and Light Collection

Understand F/#, entrance pupil, aperture diameter, light gathering and exposure behavior in optical systems.

1. What is F-number?

F-number, also written as F/#, describes the relationship between the focal length of a lens and the effective aperture diameter. It is one of the most important parameters in optical design because it affects light collection, depth of field, diffraction, exposure and optical system size.

F/# = Focal Length / Entrance Pupil Diameter

For example, a 50 mm lens with a 25 mm entrance pupil has an F-number of F/2. A 50 mm lens with a 50 mm entrance pupil has an F-number of F/1. Lower F-number means a larger aperture and higher light collection capability.

2. Aperture Diameter

If focal length and F-number are known, the effective aperture diameter can be estimated directly. This is especially useful when evaluating lens size, optical throughput and mechanical feasibility.

Aperture Diameter = Focal Length / F-number

A 100 mm F/2 lens requires approximately a 50 mm entrance pupil. A 100 mm F/1 lens requires approximately a 100 mm entrance pupil. This is why fast long-focal-length optics become physically large and mechanically more demanding.

3. Light Collection and F-number

Light collection is not proportional to F-number directly. It is proportional to the aperture area. Because aperture diameter changes with F-number, the amount of collected light changes approximately with the square of the F-number ratio.

Relative Light Collection ∝ 1 / (F/#)²

For example, an F/1.0 optical system collects approximately four times more light than an F/2.0 system, assuming similar transmission and detector conditions. This is highly important for LWIR, MWIR, SWIR, low-light visible imaging and laser spot observation systems.

4. F-number in EO/IR Systems

In electro-optical and infrared systems, F-number strongly affects sensitivity and detection performance. A lower F-number allows more energy to reach the detector, which can improve signal level and low-contrast target visibility. However, very fast optics are harder to design, manufacture, align and package.

For thermal cameras, F-number also influences the amount of infrared radiation reaching the detector. Low F-number LWIR lenses can improve thermal signal strength, but they may require larger germanium optics, tighter tolerances and more careful control of aberrations.

5. Trade-off: Fast Optics vs Image Quality

A lower F-number is not automatically better. Fast lenses may have stronger aberrations, tighter tolerance requirements, larger lens diameters and higher cost. The final choice must balance light collection, resolution, field of view, detector size, mechanical envelope, environmental robustness and manufacturability.

Lower F/# → More light, larger aperture, harder optical design
Higher F/# → Less light, smaller optics, easier aberration control

6. Practical Engineering Note

When selecting a lens for an EO/IR system, F-number should be evaluated together with focal length, detector pixel pitch, sensor format, image circle, MTF, transmission, wavelength band and environmental operating conditions. A lens that looks attractive only by F-number may not be suitable if it cannot deliver sufficient image quality across the required field.

03

Diffraction Limit and Optical Resolution

Airy disk, wavelength, F-number, pixel pitch and diffraction-limited imaging performance explained.

1. What is Diffraction?

Diffraction is a fundamental wave-optics effect that occurs when light passes through an aperture. Even a perfect lens cannot focus light into an infinitely small point. Instead, the focused spot has a finite size known as the diffraction pattern.

The central bright region of this diffraction pattern is called the Airy disk. In high-quality optical systems, the Airy disk can become one of the main limits of resolution.

2. Airy Disk Diameter

The approximate diameter of the Airy disk at the image plane depends on wavelength and F-number. This relationship is extremely important when comparing optical spot size with detector pixel pitch.

Airy Disk Diameter ≈ 2.44 × Wavelength × F-number

In this formula, wavelength and Airy disk diameter must use the same unit. If wavelength is in micrometers, the Airy disk diameter will also be in micrometers.

3. Example: Visible, SWIR and LWIR

Diffraction becomes more significant at longer wavelengths. This is why LWIR systems are much more diffraction-sensitive than visible systems for the same F-number.

Visible example: 0.55 µm at F/2 → Airy disk ≈ 2.68 µm
SWIR example: 1.55 µm at F/2 → Airy disk ≈ 7.56 µm
LWIR example: 10 µm at F/1 → Airy disk ≈ 24.4 µm

This shows why a lens that is excellent for visible imaging may not behave the same way in LWIR. Wavelength directly changes the diffraction-limited spot size.

4. Diffraction vs Pixel Pitch

A practical way to evaluate diffraction is to compare the Airy disk diameter with the detector pixel pitch. If the Airy disk is much smaller than the pixel pitch, the detector may limit the resolution. If the Airy disk is similar to or larger than the pixel pitch, diffraction becomes a major contributor to image blur.

Airy Disk < Pixel Pitch → Detector-limited or aberration-limited region
Airy Disk ≈ Pixel Pitch → Balanced optical-detector sampling
Airy Disk > Pixel Pitch → Diffraction may reduce effective resolution

For example, in a LWIR camera with 12 µm pixel pitch and an F/1.0 lens at 10 µm wavelength, the Airy disk diameter is approximately 24.4 µm. This is about two pixels wide, meaning diffraction is already an important part of the system resolution.

5. Diffraction-Limited vs Real Lens Performance

A diffraction-limited lens is a lens whose performance is mainly limited by diffraction rather than by aberrations or manufacturing errors. However, many real optical systems are not perfectly diffraction-limited, especially at wide field angles, low F-number or broad wavelength bands.

Real performance also depends on spherical aberration, coma, astigmatism, field curvature, chromatic effects, coating performance, alignment, focus error, temperature effects and mechanical tolerances.

6. MTF and Resolution

Modulation Transfer Function, or MTF, is commonly used to describe how well an optical system transfers contrast at different spatial frequencies. Even if the theoretical diffraction limit looks acceptable, the actual lens must still provide sufficient MTF at the detector sampling frequency.

Nyquist Frequency = 1 / (2 × Pixel Pitch)

If pixel pitch is 12 µm, the detector Nyquist frequency is approximately 41.7 lp/mm. The optical system should be evaluated at or near this spatial frequency to understand whether the lens can properly support the detector resolution.

7. Practical Engineering Note

Diffraction should always be considered together with pixel pitch, wavelength band, F-number and MTF. For visible systems, small pixels may be meaningful because diffraction spots are relatively small. For LWIR systems, the longer wavelength makes diffraction much more dominant, so simply reducing pixel pitch does not always improve real image detail unless the optics can support it.

Shorter wavelength → Smaller diffraction spot
Longer wavelength → Larger diffraction spot
Lower F/# → Smaller diffraction spot but harder lens design
Higher F/# → Larger diffraction spot but easier optical design
04

MTF, Pixel Pitch and Nyquist Frequency

How to judge whether an optical design is good enough for a detector, and how lens MTF combines with sensor sampling.

Main idea: MTF should not be judged only by looking at a beautiful curve. It must be evaluated at the spatial frequencies that the detector can actually sample, especially near the sensor Nyquist frequency.

1. What does MTF tell us?

Modulation Transfer Function, or MTF, describes how much contrast an optical system can transfer from the object to the image at different spatial frequencies. Low spatial frequencies represent large structures and general image contrast. High spatial frequencies represent fine details, edges and small target features.

Higher MTF at low frequency → better global contrast
Higher MTF at high frequency → better fine detail transfer

In optical design, MTF must be evaluated together with wavelength band, field position, F-number, focal length, sensor format, pixel pitch and required application performance.

2. Which spatial frequency should be used during optical design?

A practical starting point is the detector Nyquist frequency. The Nyquist frequency is the highest spatial frequency that the detector can sample without aliasing, based on pixel pitch.

Nyquist Frequency = 1 / (2 × Pixel Pitch)

Pixel pitch must be used in millimeters if the result is desired in line pairs per millimeter.

Example:
Pixel Pitch = 12 µm = 0.012 mm
Nyquist Frequency = 1 / (2 × 0.012)
Nyquist Frequency ≈ 41.7 lp/mm

Therefore, for a 12 µm detector, checking lens MTF around 40 lp/mm is highly meaningful. For a 5 µm detector, the Nyquist frequency becomes 100 lp/mm, and the optical design must support much higher spatial frequency if the small pixel size is to be fully useful.

Coarse check MTF at low frequency, such as 10–20 lp/mm
Detector-matched check MTF at Nyquist frequency
Practical balance MTF at 0.5 × Nyquist and Nyquist

3. When can we say “this MTF is sufficient”?

There is no universal single MTF number that is valid for every optical system. The acceptance threshold depends on the mission. However, a useful engineering approach is to evaluate MTF at the detector Nyquist frequency and also at half-Nyquist frequency.

Important: Do not accept a lens only because the center-field MTF looks good. The worst field position, edge/corner performance, tangential and sagittal separation, wavelength band and real detector sampling must also be considered.
Design acceptance should consider:
Center field MTF
Mid-field MTF
Edge / corner field MTF
Tangential and sagittal MTF
Polychromatic MTF over the required wavelength band
MTF at 0.5 × Nyquist and at Nyquist

As a practical rule, if the lens keeps acceptable contrast at the detector Nyquist frequency across the required field and wavelength band, the design is generally well matched to the detector. If MTF is strong only at low frequency but collapses near Nyquist, the system may produce acceptable-looking images but will not fully use the detector resolution.

4. Lens MTF alone is not the final system MTF

When the lens is mounted on a real sensor, the final image quality is not determined by lens MTF alone. The sensor also has its own sampling behavior. Pixel aperture, fill factor, detector diffusion, electronics, focus error, alignment and image processing can reduce final system contrast.

System MTF ≈ Lens MTF × Detector MTF × Electronics MTF × Processing MTF

This means a lens with high theoretical MTF may still produce lower real image sharpness if the detector sampling, focus, alignment or processing chain is not well controlled.

5. Detector MTF and pixel aperture effect

A detector pixel is not an ideal point sampler. It has a finite active area. Because of this, the detector itself reduces contrast at high spatial frequencies. A simplified one-dimensional pixel aperture MTF can be represented by a sinc function.

Detector MTF ≈ sinc(π × f × p)

Here, f is spatial frequency in lp/mm and p is pixel pitch in mm. This simplified formula shows why high-frequency detail becomes harder to preserve as spatial frequency approaches Nyquist.

Example:
Pixel Pitch = 12 µm
Nyquist ≈ 41.7 lp/mm
Even if the lens MTF is good at 41.7 lp/mm, detector sampling will still reduce the final system MTF.

6. How to decide if lens + sensor MTF is sufficient?

The correct approach is to evaluate the combined system MTF at the spatial frequency relevant to the detector. In practice, this means checking the lens MTF at the detector Nyquist frequency, estimating detector MTF, and multiplying them to estimate system-level contrast transfer.

01 Find pixel pitch

Convert pixel pitch from µm to mm.

02 Calculate Nyquist

Nyquist = 1 / (2 × pixel pitch).

03 Read lens MTF

Use MTF at Nyquist or half-Nyquist.

04 Estimate system MTF

Multiply lens MTF by detector MTF.

7. Practical example

Assume a detector has 12 µm pixel pitch. Its Nyquist frequency is approximately 41.7 lp/mm. If the lens MTF at 41.7 lp/mm is 0.45 and detector MTF at the same frequency is approximately 0.64, the estimated system MTF becomes:

System MTF ≈ 0.45 × 0.64 = 0.29

This means that although the lens alone transfers 45% contrast at Nyquist, the combined lens-sensor system may transfer approximately 29% contrast at that spatial frequency. This is why lens MTF must be interpreted together with detector sampling.

8. Design acceptance logic

During optical design, the lens should not be evaluated only by its best on-axis MTF. The decision should be made according to the worst acceptable field position and application need.

Condition Interpretation
High MTF at low frequency only Good contrast, limited fine detail
Good MTF at 0.5 × Nyquist Usually acceptable for many imaging tasks
Good MTF at Nyquist Strong detector-matched optical design
Large sagittal / tangential separation Field-dependent aberration or astigmatism risk
Poor corner MTF Edge image quality may be insufficient

9. Optical Design MTF vs Measured Final System MTF

Optical design MTF and measured final system MTF must be interpreted separately. Optical design MTF is obtained from software such as Zemax, Code V or OpticStudio. It represents the predicted lens performance under selected design assumptions such as wavelength, field position, F-number, focus condition and tolerance state.

During design review, the relevant MTF values should not be taken only from the best on-axis curve. A conservative decision should use the weakest relevant field position, the lower sagittal or tangential curve, and the tolerance degraded result whenever tolerance data are available. This gives a more realistic view of whether the optical design can support the selected detector.

Optical design review principle: Lens design MTF should be evaluated at detector-relevant spatial frequencies, especially 0.5 × Nyquist and Nyquist. The diffraction-limited MTF curve is used as the physical upper reference. The calculator compares the entered lens MTF values with practical screening regions relative to this reference.

10. Final Measured System MTF and OK/NOK Decision

Measured final system MTF is different from lens design MTF. It is obtained after the real lens, detector, mechanics, electronics and image processing chain are assembled and tested. A collimator, slanted-edge target, bar target or equivalent optical test setup may be used to obtain the measured system MTF.

For a final product, OK/NOK acceptance should ideally be based on the product specification. If the technical specification defines minimum measured system MTF values at 0.5 × Nyquist and Nyquist, those limits should be used as the formal acceptance criteria.

Important: If no formal product MTF requirement exists, the calculator result should be treated as an engineering screening result, not as a contractual qualification decision. In this case, the tool uses practical system-level screening regions to classify measured performance as OK, REVIEW or NOK.
Final System OK/NOK logic:
If formal specification exists → use the specification limit.
If no formal specification exists → use practical engineering screening bands.
Measured system MTF already includes lens, detector sampling, focus, alignment, electronics, processing and assembly effects.

Therefore, measured system MTF should not be multiplied again by detector MTF. It already represents the real integrated lens-detector system performance. If the optical design MTF is acceptable but measured system MTF is weak, the issue may come from focus, alignment, assembly, detector sampling, processing, electronics or test setup.

Practical conclusion: For EO/IR imaging systems, MTF acceptance should be linked to pixel pitch and Nyquist frequency. Lens MTF must be combined with detector MTF to estimate whether the real lens-sensor system can actually deliver the required image detail.
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